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Journal Articles

Structural defects in SiO$$_2$$/SiC interface probed by a slow positron beam

Maekawa, Masaki; Kawasuso, Atsuo; Chen, Z. Q.; Yoshikawa, Masahito; Suzuki, Ryoichi*; Odaira, Toshiyuki*

Applied Surface Science, 244(1-4), p.322 - 325, 2005/05

https://doi.org/10.1016/j.apsusc.2004.10.085
 Times Cited Count：13 Percentile：49.91(Chemistry, Physical)

no abstracts in English

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